DXF 200+

The Discovery Xenon Flash 200+ features a patented High Speed Xenon-Pulse Delivery TM source (HSXD) and a multi-faceted Light Pipe TM. Together these optics deliver a light pulse of unsurpassed power and uniform intensity to the specimen while preventing sample holder overflash. Only TA Instruments high energy Xenon design is capable of testing samples to a diameter of 25.4 mm over a temperature range from -175 °C to 900 °C. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites. The DXF platform is designed for research and development programs as well as production control.